Total-Reflection X-Ray Fluorescence Analysis and Related Methods
Издательство:
Автор
Метки:
научные исследования,химический анализ,контроль качества,метрология,нанотехнологии,кристаллография,микроскопия,спектроскопия,прикладная физика,физика твердого телаЖанры:
учебная и научная литература,научно-популярная литература,зарубежная образовательная литература,знания и навыки
Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis • Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry • Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques • Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation • Includes some 700 references for further study